Personal profile
Person Types
- Students
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Research output
- 1 Article
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High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment
Qu, Z., Duan, J., Li, A., Zhang, X., Tian, H., Wu, J., Guo, Q., Zhang, Q., Jiang, Y., Luo, N., Zhang, X., Yu, G., Long, C., Liu, W. & Wen, H., Mar 2026, In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review